Media type: E-Article Title: Quantitative analysis of static capacitance contrast in scanning electron microscopy Contributor: Feng, R.-J. Published: Oxford University Press (OUP), 2003 Published in: Journal of Electron Microscopy, 52 (2003) 5, Seite 455-458 Language: English DOI: 10.1093/jmicro/52.5.455 ISSN: 0022-0744; 1477-9986 Keywords: Instrumentation Origination: Footnote: