Description:
<jats:title>Abstract</jats:title><jats:p>Here the fabrication of an inorganic metal‐halide perovskite CsPbBr<jats:sub>3</jats:sub> based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm<jats:sup>2</jats:sup> range. The CsPbBr<jats:sub>3</jats:sub> film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm<jats:sup>2</jats:sup> V<jats:sup>−1</jats:sup> s<jats:sup>−1</jats:sup>. An X‐ray to current conversion rate of 1450 µC Gy<jats:sub>air</jats:sub><jats:sup>−1</jats:sup> cm<jats:sup>−2</jats:sup> at an electric field of 1.2 × 10<jats:sup>4</jats:sup> V cm<jats:sup>−1</jats:sup> and a detection limit in the sub <jats:italic>µ</jats:italic>Gy<jats:sub>air</jats:sub> s<jats:sup>−1</jats:sup> regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr<jats:sub>3</jats:sub> films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.</jats:p>