Single‐crystal sapphire microstructure for high‐resolution synchrotron X‐ray monochromators

Media type: E-Article
Title: Single‐crystal sapphire microstructure for high‐resolution synchrotron X‐ray monochromators
Contributor: Asadchikov, Victor E.; Butashin, Andrey V.; Buzmakov, Alexey V.; Deryabin, Alexander N.; Kanevsky, Vladimir M.; Prokhorov, Igor A.; Roshchin, Boris S.; Volkov, Yuri O.; Zolotov, Denis A.; Jafari, Atefeh; Alexeev, Pavel; Cecilia, Angelica; Baumbach, Tilo; Bessas, Dimitrios; Danilewsky, Andreas N.; Sergueev, Ilya; Wille, Hans‐Christian; Hermann, Raphaël P.
imprint: Wiley, 2016
Published in: Crystal Research and Technology
Language: English
DOI: 10.1002/crat.201500343
ISSN: 0232-1300; 1521-4079
Keywords: Condensed Matter Physics ; General Materials Science ; General Chemistry
Origination:
Footnote:
Description: <jats:p>We report on the growth and characterization of sapphire single crystals for X‐ray optics applications. Structural defects were studied by means of laboratory double‐crystal X‐ray diffractometry and white‐beam synchrotron‐radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique. Therein the dislocation density was 10<jats:sup>2</jats:sup>–10<jats:sup>3</jats:sup> cm<jats:sup>−2</jats:sup> and a small area with approximately 2*2 mm<jats:sup>2</jats:sup> did not show dislocation contrast in many reflections. This crystal has suitable quality for application as a backscattering monochromator. A clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.</jats:p>

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