> Details

Höche, H. R.

P. Krishna (ed.). Recent advances in X‐ray characterization of materials — II. Progress in crystal growth and characterization vol. 18. Pergamon Press 1989, 271 pages, 136 Figures, 12 Tables, $ 225.00, ISBN 0‐08‐037368‐2

Reference
management

Bookmarks

Remove from
bookmarks

Share this on Whatsapp

Close

Bookmarks



You can manage bookmarks using lists, please log in to your user account for this.
  • Media type: E-Article
  • Title: P. Krishna (ed.). Recent advances in X‐ray characterization of materials — II. Progress in crystal growth and characterization vol. 18. Pergamon Press 1989, 271 pages, 136 Figures, 12 Tables, $ 225.00, ISBN 0‐08‐037368‐2
  • Contributor: Höche, H. R.
  • imprint: Wiley, 1990
  • Published in: Crystal Research and Technology
  • Language: English
  • DOI: 10.1002/crat.2170250523
  • ISSN: 0232-1300; 1521-4079
  • Keywords: Condensed Matter Physics ; General Materials Science ; General Chemistry
  • Origination:
  • Footnote: