Media type: E-Article Title: Fitting the momentum dependent loss function in EELS Contributor: Bertoni, Giovanni; Verbeeck, Jo; Brosens, Fons Published: Wiley, 2011 Published in: Microscopy Research and Technique, 74 (2011) 3, Seite 212-218 Language: English DOI: 10.1002/jemt.20894 ISSN: 1097-0029; 1059-910X Keywords: Medical Laboratory Technology ; Instrumentation ; Histology ; Anatomy Origination: Footnote: Description: AbstractMomentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. Microsc. Res. Tech., 2010. © 2010 Wiley‐Liss, Inc.