• Media type: E-Article
  • Title: Dielectric surface passivation for silicon solar cells: A review
  • Contributor: Bonilla, Ruy S.; Hoex, Bram; Hamer, Phillip; Wilshaw, Peter R.
  • imprint: Wiley, 2017
  • Published in: physica status solidi (a)
  • Language: English
  • DOI: 10.1002/pssa.201700293
  • ISSN: 1862-6300; 1862-6319
  • Origination:
  • Footnote:
  • Description: <jats:sec><jats:label /><jats:p>Silicon wafer solar cells continue to be the leading photovoltaic technology, and in many places are now providing a substantial portion of electricity generation. Further adoption of this technology will require processing that minimises losses in device performance. A fundamental mechanism for efficiency loss is the recombination of photo‐generated charge carriers at the unavoidable cell surfaces. Dielectric coatings have been shown to largely prevent these losses through a combination of different passivation mechanisms. This review aims to provide an overview of the dielectric passivation coatings developed in the past two decades using a standardised methodology to characterise the metrics of surface recombination across all techniques and materials. The efficacy of a large set of materials and methods has been evaluated using such metrics and a discussion on the current state and prospects for further surface passivation improvements is provided.</jats:p></jats:sec>