The Influence of the Primary X‐Ray Beam Divergence on the X‐Ray Wave Field Absorption Coefficients Measured by Means of the Three‐Crystal X‐Ray Spectrometer
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Media type:
E-Article
Title:
The Influence of the Primary X‐Ray Beam Divergence on the X‐Ray Wave Field Absorption Coefficients Measured by Means of the Three‐Crystal X‐Ray Spectrometer
Contributor:
Godwod, K.;
Kowalczyk, R.;
Lefeld‐Sosnowska, M.
Published:
Wiley, 1966
Published in:
physica status solidi (b), 17 (1966) 2, Seite 869-874
Description:
AbstractAn analysis is made of the effect of the primary X‐ray beam divergence on the dependence of the reflected power on crystal thickness d (for Laue diffraction). It is shown that this effect is important, and should be taken into account in the interpretation of experimental data. Calculations are performed for the (220) reflection of a Si single crystal for CuKα1 radiation under the assumption that the monochromator broadening function V(y) can be approximated by a Gaussian function with width ωv. The curves calculated for several ωv are presented.