Media type: E-Article Title: Improved setup for studying the low-frequency noise in semiconductor devices and structures Contributor: Sokolik, S. A.; Gulyaev, A. M.; Miroshnikova, I. N. Published: Springer Science and Business Media LLC, 1997 Published in: Measurement Techniques, 40 (1997) 1, Seite 85-90 Language: English DOI: 10.1007/bf02505172 ISSN: 1573-8906; 0543-1972 Keywords: Applied Mathematics ; Instrumentation Origination: Footnote: