Media type: E-Article Title: Use of precision density and lattice parameter measurements for study of point defects in single crystals of semiconductors Contributor: Morozov, A.N.; Bublik, V.T. Published: Elsevier BV, 1986 Published in: Journal of Crystal Growth, 75 (1986) 3, Seite 491-496 Language: English DOI: 10.1016/0022-0248(86)90094-1 ISSN: 0022-0248 Origination: Footnote: