Media type: E-Article Title: Field ion microscopy of silicon Contributor: Sakurai, Toshio Published: Elsevier BV, 1979 Published in: Surface Science, 86 (1979), Seite 562-571 Language: English DOI: 10.1016/0039-6028(79)90435-7 ISSN: 0039-6028 Origination: Footnote: