Media type: E-Article Title: SIMS profiling of AlSi interfaces in the presence of oxygen in the ion source or in the analysis chamber Contributor: Todorov, S.S.; Chakarov, I.R.; Miteva, V.; Karpuzov, D.S.; Klyachko, D.V.; Uvarov, V.V.; Shinkorenko, V. imprint: Elsevier BV, 1992 Published in: Surface Science Language: English DOI: 10.1016/0039-6028(92)90924-u ISSN: 0039-6028 Keywords: Materials Chemistry ; Surfaces, Coatings and Films ; Surfaces and Interfaces ; Condensed Matter Physics Origination: Footnote: