Media type: E-Article Title: Density, thickness and interface roughness of SiO2, TiO2 and Ta2O5 films on BK-7 glasses analyzed by x-ray reflection Contributor: Hüppauff, Martin; Bange, Klaus; Lengeler, Bruno imprint: Elsevier BV, 1993 Published in: Thin Solid Films Language: English DOI: 10.1016/0040-6090(93)90514-p ISSN: 0040-6090 Origination: Footnote: