Media type: E-Article Title: Quantitative analysis of doping profile on beveled p-type GaAs structures by micro-Raman spectroscopy Contributor: Srnanek, R.; Irmer, G.; Donoval, D.; Vincze, A.; Sciana, B.; Radziewicz, D.; Tlaczala, M. Published: Elsevier BV, 2008 Published in: Microelectronics Journal, 39 (2008) 12, Seite 1605-1612 Language: English DOI: 10.1016/j.mejo.2008.02.019 ISSN: 1879-2391 Origination: Footnote: