Media type: E-Article Title: Editorial Contributor: Liou, Juin J.; Lai, Chao Sung imprint: Elsevier BV, 2010 Published in: Microelectronics Reliability Language: English DOI: 10.1016/j.microrel.2010.02.010 ISSN: 0026-2714 Keywords: Electrical and Electronic Engineering ; Surfaces, Coatings and Films ; Safety, Risk, Reliability and Quality ; Condensed Matter Physics ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: