Yang, Yang;
Liu, Ruimin;
McIntosh, Keith R.;
Abbott, Malcolm;
Sudbury, Ben;
Holovsky, Jakub;
Ye, Feng;
Deng, Weiwei;
Feng, Zhiqiang;
Verlinden, Pierre J.;
Altermatt, Pietro P.
Combining ray tracing with device modeling to evaluate experiments for an optical analysis of crystalline Si solar cells and modules