Media type: E-Article Title: Characterization of Semiconductor Surface Conductivity by Using Microscopic Four-Point Probe Technique Contributor: Li, J.C.; Wang, Y.; Ba, D.C. Published: Elsevier BV, 2012 Published in: Physics Procedia, 32 (2012), Seite 347-355 Language: English DOI: 10.1016/j.phpro.2012.03.568 ISSN: 1875-3892 Origination: Footnote: Access State: Open Access