Media type: E-Article Title: Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy Contributor: Hermann, Peter; Hecker, Michael; Chumakov, Dmytro; Weisheit, Martin; Rinderknecht, Jochen; Shelaev, Artem; Dorozhkin, Pavel; Eng, Lukas M. imprint: Elsevier BV, 2011 Published in: Ultramicroscopy Language: English DOI: 10.1016/j.ultramic.2011.08.009 ISSN: 0304-3991 Keywords: Instrumentation ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: