Media type: E-Article Title: Continuous capacitance–voltage spectroscopy mapping for scanning microwave microscopy Contributor: Moertelmaier, M.; Huber, H.P.; Rankl, C.; Kienberger, F. Published: Elsevier BV, 2014 Published in: Ultramicroscopy, 136 (2014), Seite 67-72 Language: English DOI: 10.1016/j.ultramic.2013.07.011 ISSN: 0304-3991 Keywords: Instrumentation ; Atomic and Molecular Physics, and Optics ; Electronic, Optical and Magnetic Materials Origination: Footnote: