Media type: E-Article Title: Quantitative analysis of electron microscopic micrographs of multilayers Contributor: Schuhrke, T.; Zweck, J.; Hoffmann, H. imprint: Elsevier BV, 1997 Published in: Thin Solid Films Language: English DOI: 10.1016/s0040-6090(96)08976-6 ISSN: 0040-6090 Keywords: Materials Chemistry ; Metals and Alloys ; Surfaces, Coatings and Films ; Surfaces and Interfaces ; Electronic, Optical and Magnetic Materials Origination: Footnote: