Media type: E-Article Title: Electrical characterization of defects induced by 12 MeV electrons in p—type Si-SiO2 structures Contributor: Stefanov, KG; Kaschieva, S; Karpuzov, D Published: Elsevier BV, 1998 Published in: Vacuum, 51 (1998) 2, Seite 235-237 Language: English DOI: 10.1016/s0042-207x(98)00166-3 ISSN: 0042-207X Keywords: Surfaces, Coatings and Films ; Condensed Matter Physics ; Instrumentation Origination: Footnote: