Media type: E-Article Title: In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures Contributor: Niehuis, Ewald; Moellers, Rudolf; Kollmer, Felix; Arlinghaus, Henrik; Bernard, Laetita; Josef Hug, Hans; Vranjkovic, Sasa; Dianoux, Raphaelle; Scheidemann, Adi imprint: Oxford University Press (OUP), 2014 Published in: Microscopy and Microanalysis Language: English DOI: 10.1017/s1431927614012161 ISSN: 1431-9276; 1435-8115 Keywords: Instrumentation Origination: Footnote: