Media type: E-Article Title: Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium Contributor: Niculae, Adrian; Barros, Thiago; Bechteler, Alois; Hermenau, Kathrin; Heinzinger, Klaus; Liebel, Andreas; Soltau, Heike; Strüder, Lothar imprint: Oxford University Press (OUP), 2019 Published in: Microscopy and Microanalysis Language: English DOI: 10.1017/s1431927619009577 ISSN: 1431-9276; 1435-8115 Keywords: Instrumentation Origination: Footnote: