> Details

Steinegger, Patrick; Asai, Masato; Dressler, Rugard; Eichler, Robert; Kaneya, Yusuke; Mitsukai, Akina; Nagame, Yuichiro; Piguet, Dave; Sato, Tetsuya K.; Schädel, Matthias; Takeda, Shinsaku; Toyoshima, Atsushi; Tsukada, Kazuaki; Türler, Andreas; Vascon, Alessio

Vacuum Chromatography of Tl on SiO2 at the Single-Atom Level

Reference
management

Bookmarks

Remove from
bookmarks

Share this on Whatsapp

Close

Bookmarks



You can manage bookmarks using lists, please log in to your user account for this.
  • Media type: E-Article
  • Title: Vacuum Chromatography of Tl on SiO2 at the Single-Atom Level
  • Contributor: Steinegger, Patrick; Asai, Masato; Dressler, Rugard; Eichler, Robert; Kaneya, Yusuke; Mitsukai, Akina; Nagame, Yuichiro; Piguet, Dave; Sato, Tetsuya K.; Schädel, Matthias; Takeda, Shinsaku; Toyoshima, Atsushi; Tsukada, Kazuaki; Türler, Andreas; Vascon, Alessio
  • Published: American Chemical Society (ACS), 2016
  • Published in: The Journal of Physical Chemistry C, 120 (2016) 13, Seite 7122-7132
  • Language: English
  • DOI: 10.1021/acs.jpcc.5b12033
  • ISSN: 1932-7447; 1932-7455
  • Keywords: Surfaces, Coatings and Films ; Physical and Theoretical Chemistry ; General Energy ; Electronic, Optical and Magnetic Materials
  • Origination:
  • University thesis:
  • Footnote: