Published in:
Nanoscale, 9 (2017) 48, Seite 19290-19297
Language:
English
DOI:
10.1039/c7nr06714c
ISSN:
2040-3364;
2040-3372
Origination:
Footnote:
Description:
A non-destructive piezo-response force microscopy (PFM) technique is presented for mapping piezoelectricity in nanoscale systems previously inaccessible by conventional PFM.