Media type: E-Article Title: An Investigation on Hot-Carrier Reliability and Degradation Index in Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors Contributor: Tian, Kuen-Shiuan; Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Lee, J. R.; Huang, Tsung-Yi; Liu, C. M.; Hsu, S. L. Published: IOP Publishing, 2008 Published in: Japanese Journal of Applied Physics, 47 (2008) 4S, Seite 2641 Language: Not determined DOI: 10.1143/jjap.47.2641 ISSN: 0021-4922; 1347-4065 Keywords: General Physics and Astronomy ; General Engineering Origination: Footnote: