Media type: E-Article Title: (Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography Contributor: Pareige, Philippe; Lardé, Rodrigue; Gourbilleau, Fabrice; Talbot, Etienne imprint: The Electrochemical Society, 2011 Published in: ECS Meeting Abstracts Language: Not determined DOI: 10.1149/ma2011-01/19/1252 ISSN: 2151-2043 Keywords: General Medicine Origination: Footnote: Description: <jats:p>Abstract not Available.</jats:p> Access State: Open Access