Media type: E-Article Title: "Gated-diode" in SOI MOSFETs: a sensitive tool for characterizing the buried Si/SiO/sub 2/ interface Contributor: Xuejun Zhao; Ioannou, D.E. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2001 Published in: IEEE Transactions on Electron Devices Language: Not determined DOI: 10.1109/16.915689 ISSN: 0018-9383 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: