Media type: E-Article Title: A fundamental performance limit of optimized 3.3-V sub-quarter-micrometer fully overlapped LDD MOSFET's Contributor: Bryant, A.; El-Kareh, B.; Furukawa, T.; Noble, W.P.; Nowak, E.J.; Schwittek, W.; Tonti, W. Published: Institute of Electrical and Electronics Engineers (IEEE), 1992 Published in: IEEE Transactions on Electron Devices, 39 (1992) 5, Seite 1208-1215 Language: Not determined DOI: 10.1109/16.129105 ISSN: 0018-9383 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: University thesis: Footnote: