Media type: E-Article Title: Automatic monitoring of electrical parameters in the semiconductor industry based on ROC Contributor: Riess, E. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2000 Published in: IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans Language: Not determined DOI: 10.1109/3468.895919 ISSN: 1083-4427 Keywords: Electrical and Electronic Engineering ; Computer Science Applications ; Human-Computer Interaction ; Control and Systems Engineering ; Software Origination: Footnote: