Media type: E-Article Title: Low Cost Hypercompression of Test Data Contributor: Huang, Yu; Milewski, Sylwester; Rajski, Janusz; Tyszer, Jerzy; Wang, Chen imprint: Institute of Electrical and Electronics Engineers (IEEE), 2020 Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Language: Not determined DOI: 10.1109/tcad.2019.2945760 ISSN: 0278-0070; 1937-4151 Keywords: Electrical and Electronic Engineering ; Computer Graphics and Computer-Aided Design ; Software Origination: Footnote: