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Salatino, Maria; Hubmayr, Johannes; Li, Yaqiong; Niemack, Michael D.; Simon, Sara M.; Staggs, Suzanne T.; Wollack, Edward J.; Austermann, Jason; Beall, James A.; Choi, Steve; Crowley, Kevin T.; Duff, Shannon; Henderson, Shawn W.; Hilton, Gene; Ho, S.-P. P.

Machine Learning, Markov Chain Monte Carlo, and Optimal Algorithms to Characterize the AdvACT Kilopixel Transition-Edge Sensor Arrays

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  • Media type: E-Article
  • Title: Machine Learning, Markov Chain Monte Carlo, and Optimal Algorithms to Characterize the AdvACT Kilopixel Transition-Edge Sensor Arrays
  • Contributor: Salatino, Maria; Hubmayr, Johannes; Li, Yaqiong; Niemack, Michael D.; Simon, Sara M.; Staggs, Suzanne T.; Wollack, Edward J.; Austermann, Jason; Beall, James A.; Choi, Steve; Crowley, Kevin T.; Duff, Shannon; Henderson, Shawn W.; Hilton, Gene; Ho, S.-P. P.
  • Published: Institute of Electrical and Electronics Engineers (IEEE), 2019
  • Published in: IEEE Transactions on Applied Superconductivity, 29 (2019) 5, Seite 1-5
  • Language: Without Specification
  • DOI: 10.1109/tasc.2019.2910542
  • ISSN: 1051-8223; 1558-2515; 2378-7074
  • Keywords: Electrical and Electronic Engineering ; Condensed Matter Physics ; Electronic, Optical and Magnetic Materials
  • Origination:
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