Media type: E-Article Title: BTI characteristics and mechanisms of metal gated HfO/sub 2/ films with enhanced interface/bulk process treatments Contributor: Kalpat, S.; Hsing-Huang Tseng; Ramon, M.; Moosa, M.; Tekleab, D.; Tobin, P.J.; Gilmer, D.C.; Hegde, R.I.; Capasso, C.; Tracy, C.; White, B.E. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2005 Published in: IEEE Transactions on Device and Materials Reliability Language: Not determined DOI: 10.1109/tdmr.2005.845879 ISSN: 1530-4388 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality ; Electronic, Optical and Magnetic Materials Origination: Footnote: