Media type: E-Article Title: AC Variability and Endurance Measurement Technique for Resistive Switching Memories Contributor: Deora, S.; Bersuker, G.; Matthews, K.; Gilmer, D. C.; Kirsch, P. D. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2014 Published in: IEEE Transactions on Device and Materials Reliability Language: Not determined DOI: 10.1109/tdmr.2013.2291994 ISSN: 1530-4388; 1558-2574 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality ; Electronic, Optical and Magnetic Materials Origination: Footnote: