Media type: E-Article Title: Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis Contributor: Zambelli, Cristian; Crippa, Luca; Micheloni, Rino; Olivo, Piero imprint: Institute of Electrical and Electronics Engineers (IEEE), 2021 Published in: IEEE Transactions on Device and Materials Reliability Language: Not determined DOI: 10.1109/tdmr.2021.3108941 ISSN: 1530-4388; 1558-2574 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality ; Electronic, Optical and Magnetic Materials Origination: Footnote: