Media type: E-Article Title: Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI Contributor: Chohan, Talha; Zhao, Zhixing; Lehmann, Steffen; Arfaoui, Wafa; Bossu, Germain; Trommer, Jens; Slesazeck, Stefan; Mikolajick, Thomas; Siddabathula, Mahesh imprint: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Transactions on Device and Materials Reliability Language: Not determined DOI: 10.1109/tdmr.2022.3183630 ISSN: 1530-4388; 1558-2574 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality ; Electronic, Optical and Magnetic Materials Origination: Footnote: