Media type: E-Article Title: A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model Contributor: Joshi, Kaustubh; Mukhopadhyay, Subhadeep; Goel, Nilesh; Nanware, Nirmal; Mahapatra, Souvik imprint: Institute of Electrical and Electronics Engineers (IEEE), 2014 Published in: IEEE Transactions on Electron Devices Language: Not determined DOI: 10.1109/ted.2013.2295844 ISSN: 0018-9383; 1557-9646 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: