Media type: E-Article Title: A Fault Detection Method for Partial Chip Failure in Multichip IGBT Modules Based on Turn-Off Delay Time Contributor: Luo, Dan; Chen, Minyou; Lai, Wei; Xia, Hongjian; Li, Hanrui; Yu, Kai imprint: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Transactions on Electron Devices Language: Not determined DOI: 10.1109/ted.2022.3168535 ISSN: 0018-9383; 1557-9646 Keywords: Electrical and Electronic Engineering ; Electronic, Optical and Magnetic Materials Origination: Footnote: