Media type: E-Article Title: Microscopic Simulation of the RF Performance of SiGe HBTs With Additional Uniaxial Mechanical Stress Contributor: Dieball, Oliver; Rucker, Holger; Heinemann, Bernd; Jungemann, Christoph Published: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Transactions on Electron Devices, 69 (2022) 9, Seite 4803-4809 Language: Not determined DOI: 10.1109/ted.2022.3189322 ISSN: 0018-9383; 1557-9646 Origination: Footnote: