Media type: E-Article Title: Millimeter-Wave On-Wafer TRL Calibration Employing 3-D EM Simulation-Based Characteristic Impedance Extraction Contributor: Galatro, Luca; Spirito, Marco Published: Institute of Electrical and Electronics Engineers (IEEE), 2017 Published in: IEEE Transactions on Microwave Theory and Techniques, 65 (2017) 4, Seite 1315-1323 Language: Not determined DOI: 10.1109/tmtt.2016.2609413 ISSN: 0018-9480; 1557-9670 Origination: Footnote: