Media type: E-Article Title: Anomalous Negative Bias Temperature Instability Degradation Induced by Source/Drain Bias in Nanoscale PMOS Devices Contributor: Baoguang Yan; Jingfeng Yang; Zhiliang Xia; Xiaoyan Liu; Gang Du; Ruqi Han; Jinfeng Kang; Liao, C.C.; Zhenghao Gan; Miao Liao; Wang, J.P.; Waisum Wong imprint: Institute of Electrical and Electronics Engineers (IEEE), 2008 Published in: IEEE Transactions on Nanotechnology Language: Not determined DOI: 10.1109/tnano.2008.926343 ISSN: 1536-125X; 1941-0085 Keywords: Electrical and Electronic Engineering ; Computer Science Applications Origination: Footnote: