Media type: E-Article Title: Corrections to “Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs” [2021 459-465] Contributor: Weimer, Christoph; Pacheco-Sanchez, Anibal; Trommer, Jens; Schroter, Michael imprint: Institute of Electrical and Electronics Engineers (IEEE), 2021 Published in: IEEE Transactions on Nanotechnology Language: Not determined DOI: 10.1109/tnano.2021.3093663 ISSN: 1536-125X; 1941-0085 Keywords: Electrical and Electronic Engineering ; Computer Science Applications Origination: Footnote: