Media type: E-Article Title: The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability Contributor: Mayer, Donald C.; Koga, Rokutaro; Womack, James M. Published: Institute of Electrical and Electronics Engineers (IEEE), 2007 Published in: IEEE Transactions on Nuclear Science, 54 (2007) 6, Seite 2120-2124 Language: Not determined DOI: 10.1109/tns.2007.910294 ISSN: 0018-9499 Keywords: Electrical and Electronic Engineering ; Nuclear Energy and Engineering ; Nuclear and High Energy Physics Origination: Footnote: