Media type: E-Article Title: Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs Contributor: Clemente, Juan Antonio; Franco, Francisco J.; Villa, Francesca; Baylac, Maud; Rey, Solenne; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul Published: Institute of Electrical and Electronics Engineers (IEEE), 2016 Published in: IEEE Transactions on Nuclear Science, 63 (2016) 4, Seite 2087-2094 Language: Not determined DOI: 10.1109/tns.2016.2551263 ISSN: 0018-9499; 1558-1578 Keywords: Electrical and Electronic Engineering ; Nuclear Energy and Engineering ; Nuclear and High Energy Physics Origination: Footnote: