Cryogenic Total-Ionizing-Dose Response of 4th-Generation SiGe HBTs Using 1-MeV Electrons for Europa-Surface Applications

Media type: E-Article
Title: Cryogenic Total-Ionizing-Dose Response of 4th-Generation SiGe HBTs Using 1-MeV Electrons for Europa-Surface Applications
Contributor: Teng, Jeffrey W.; Nergui, Delgermaa; Tzintzarov, George N.; Ringel, Brett L.; Brumbach, Zachary R.; Heimerl, Justin P.; Mensah, Yaw A.; Moody, Jackson P.; Thorbourn, Dennis O.; Castillo, Linda Del; Mojarradi, Mohammad M.; Blalock, Benjamin J.; Cressler, John D.
imprint: Institute of Electrical and Electronics Engineers (IEEE), 2023
Published in: IEEE Transactions on Nuclear Science
Language: Not determined
DOI: 10.1109/tns.2022.3226452
ISSN: 0018-9499; 1558-1578
Keywords: Electrical and Electronic Engineering ; Nuclear Energy and Engineering ; Nuclear and High Energy Physics
Origination:
Footnote:

Search in field: