Media type: E-Article Title: Bayes Risk Error is a Bregman Divergence Contributor: Varshney, Kush R. Published: Institute of Electrical and Electronics Engineers (IEEE), 2011 Published in: IEEE Transactions on Signal Processing, 59 (2011) 9, Seite 4470-4472 Language: Not determined DOI: 10.1109/tsp.2011.2159500 ISSN: 1053-587X; 1941-0476 Keywords: Electrical and Electronic Engineering ; Signal Processing Origination: Footnote: