Media type: E-Article Title: Investigation on the Faulty State of DFIG in a Microgrid Contributor: Chen, Minyou; Yu, Lei; Wade, Neal S.; Liu, Xiaoqin; Liu, Qing; Yang, Fan imprint: Institute of Electrical and Electronics Engineers (IEEE), 2011 Published in: IEEE Transactions on Power Electronics Language: Not determined DOI: 10.1109/tpel.2010.2094626 ISSN: 0885-8993; 1941-0107 Keywords: Electrical and Electronic Engineering Origination: Footnote: