Media type: E-Article Title: A multi-step stress-strength model of a parallel system Contributor: Necsulescu, Dan S.; Krausz, Alexander S. Published: Institute of Electrical and Electronics Engineers (IEEE), 1986 Published in: IEEE Transactions on Reliability, 35 (1986) 2, Seite 160-160 Language: Not determined DOI: 10.1109/tr.1986.4335391 ISSN: 0018-9529; 1558-1721 Keywords: Electrical and Electronic Engineering ; Safety, Risk, Reliability and Quality Origination: Footnote: