Media type: E-Article Title: Deep-level analysis in (AlGa)As—GaAs 2-D electron gas devices by means of low-frequency noise measurements Contributor: Loreck, L.; Dambkes, H.; Heime, K.; Ploog, K.; Weimann, G. Published: Institute of Electrical and Electronics Engineers (IEEE), 1984 Published in: IEEE Electron Device Letters, 5 (1984) 1, Seite 9-11 Language: Not determined DOI: 10.1109/edl.1984.25812 ISSN: 0741-3106 Origination: Footnote: