Media type: E-Article Title: Dynamic Avalanche Limit and Current Filamentation Onset Limit in 4H-Silicon Carbide High-Voltage Diodes Contributor: Johannesson, Daniel; Nawaz, Muhammad; Nee, Hans-Peter imprint: Institute of Electrical and Electronics Engineers (IEEE), 2022 Published in: IEEE Journal of Emerging and Selected Topics in Power Electronics Language: Not determined DOI: 10.1109/jestpe.2021.3100146 ISSN: 2168-6777; 2168-6785 Keywords: Electrical and Electronic Engineering ; Energy Engineering and Power Technology Origination: Footnote: