Media type: E-Article Title: Implications of Accelerated Recombination-Active Defect Complex Formation for Mitigating Carrier-Induced Degradation in Silicon Contributor: Hallam, Brett J.; Abbott, Malcolm D.; Nampalli, Nitin; Hamer, Phill G.; Wenham, Stuart R. imprint: Institute of Electrical and Electronics Engineers (IEEE), 2016 Published in: IEEE Journal of Photovoltaics Language: Not determined DOI: 10.1109/jphotov.2015.2494691 ISSN: 2156-3381; 2156-3403 Keywords: Electrical and Electronic Engineering ; Condensed Matter Physics ; Electronic, Optical and Magnetic Materials Origination: Footnote: